Abstract :
The purpose of the session is to discuss the relationship between DFM, test, and yield. The first talk shows how modifying a library can allow yield tradeoffs to be managed along with other design parameters (area, power, performance). The second portion talks about test methods for providing information to the fab, with specific examples of current issues, and the final part shows how a DFM tool and a test tool can be linked to provide complementary checks at both the DRC and test level (a combination of rules and directed tests).
