• DocumentCode
    3388295
  • Title

    Graphene junction field-effect transistor

  • Author

    Tzu-Min Ou ; Borsa, Tomoko ; Van Zeghbroeck, Bart

  • Author_Institution
    Dept. of Electr., Comput., & Energy Eng., Univ. of Colorado - Boulder, Boulder, CO, USA
  • fYear
    2015
  • fDate
    21-24 June 2015
  • Firstpage
    139
  • Lastpage
    140
  • Abstract
    Summary form only given. Graphene is known for its high carrier mobility and high saturation velocity . The majority of graphene transistors in the literature-including MOSFETs, barristors, and tunneling FETs-have a gate separated from the channel by a conventional or high-K dielectric layer. In this paper we demonstrate for the first time a lateral graphene FET gated by a graphene/semiconductor heterojunction. The device consists of a p-type graphene channel and an n-type semiconductor gate. Since no metal/dielectric-stacked gate is used, the device is referred to as graphene junction FET (G-JFET). Such a device is of interest as an alternate to G-MOSFETs, or as a back gate for G-MOSFETs with the feature that the device´s Dirac voltage (VDirac) can be tuned by the doping density of semiconductor gate. This G-JFET device demonstrates for the first time the feasibility of using a graphene/n-semiconductor Schottky junction as the gate mechanism to control the conductivity of a graphene channel. The Schottky-junction back gate of a G-JFET also provides an additional degree of freedom to tune the VDirac of each individual transistor by doping specific regions underneath the graphene channel.
  • Keywords
    Schottky barriers; field effect transistors; graphene devices; C; Dirac voltage; G-MOSFET alternative; G-MOSFET back gate; gate mechanism; graphene channel conductivity control; graphene junction field effect transistor; graphene-semiconductor Schottky junction; graphene-semiconductor heterojunction; lateral graphene FET; n-type semiconductor gate; p-type graphene channel; Dielectrics; Doping; Gold; Graphene; High K dielectric materials; Logic gates; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2015 73rd Annual
  • Conference_Location
    Columbus, OH
  • Print_ISBN
    978-1-4673-8134-5
  • Type

    conf

  • DOI
    10.1109/DRC.2015.7175594
  • Filename
    7175594