• DocumentCode
    3388478
  • Title

    SOS current mirror matching at 4K: A brief study

  • Author

    Das, Kushal ; Lehmann, Torsten

  • Author_Institution
    Centre for Quantum Comput. Technol., Univ. of New South Wales, Sydney, NSW, Australia
  • fYear
    2010
  • fDate
    May 30 2010-June 2 2010
  • Firstpage
    3405
  • Lastpage
    3408
  • Abstract
    Current architectures for the control and readout of silicon qubits often involve the use of classical CMOS electronics used at temperatures below 4K. Fully depleted silicon on insulator CMOS is a primary candidate for such electronics as they are less affected by low temperature bulk induced hysteresis and kink effects and have lower parasitic capacitances than their bulk counterparts. While MOS transistors are known to work at low temperatures, a hitherto unexplored maxim of integrated circuit design is the use of matched components at low temperatures. In this study, we investigate the effect of low temperature operation on the matching in CMOS current mirrors: we compare measurements of the low frequency accuracy in a silicon on sapphire mirror at 300K and 4K. We find that while matching is reduced at low temperatures, circuit structures relying on matching components can still be employed at low temperatures albeit at reduced performance.
  • Keywords
    CMOS integrated circuits; integrated circuit design; silicon-on-insulator; CMOS current mirrors; CMOS electronics; SOS current mirror matching; low temperature operation; parasitic capacitance; sapphire mirror; silicon on insulator; silicon qubits; temperature 300 K; temperature 4 K; Current measurement; Frequency measurement; Hysteresis; Integrated circuit measurements; Integrated circuit synthesis; MOSFETs; Mirrors; Parasitic capacitance; Silicon on insulator technology; Temperature control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-5308-5
  • Electronic_ISBN
    978-1-4244-5309-2
  • Type

    conf

  • DOI
    10.1109/ISCAS.2010.5537861
  • Filename
    5537861