• DocumentCode
    33885
  • Title

    Design and Analysis of 3D-MAPS (3D Massively Parallel Processor with Stacked Memory)

  • Author

    Dae Hyun Kim ; Athikulwongse, K. ; Healy, M.B. ; Hossain, M.M. ; Moongon Jung ; Khorosh, I. ; Kumar, G. ; Young-Joon Lee ; Lewis, D.L. ; Tzu-Wei Lin ; Chang Liu ; Panth, S. ; Pathak, M. ; Minzhen Ren ; Guanhao Shen ; Taigon Song ; Dong Hyuk Woo ; Xin Zhao

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    64
  • Issue
    1
  • fYear
    2015
  • fDate
    Jan. 2015
  • Firstpage
    112
  • Lastpage
    125
  • Abstract
    This paper describes the architecture, design, analysis, and simulation and measurement results of the 3D-MAPS (3D massively parallel processor with stacked memory) chip built with a 1.5 V, 130 nm process technology and a two-tier 3D stacking technology using 1.2 microm-diameter, 6 micro m-height through-silicon vias (TSVs) and 3.4nbspmicrom-diameter face-to-face bond pads. 3D-MAPS consists of a core tier containing 64 cores and a memory tier containing 64 memory blocks. Each core communicates with its dedicated 4KB SRAM block using face-to-face bond pads, which provide negligible data transfer delay between the core and the memory tiers. The maximum operating frequency is 277 MHz and the maximum memory bandwidth is 70.9 GB/s at 277 MHz. The peak measured memory bandwidth usage is 63.8 GB/s and the peak measured power is approximately 4 W based on eight parallel benchmarks.
  • Keywords
    parallel processing; storage management; 3D massively parallel processor with stacked memory; 3D-MAPS; face-to-face bond pads; frequency 277 MHz; parallel benchmarks; power 4 W; two-tier 3D stacking technology; Bandwidth; Multicore processing; Three-dimensional displays; Through-silicon vias; 3D Multiprocessor-memory stacked systems; 3D integrated circuits; Computer-aided design; RTL implementation and simulation;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.2013.192
  • Filename
    6616546