• DocumentCode
    3388536
  • Title

    Improving coverage analysis and test generation for large designs

  • Author

    Bergmann, J.P. ; Horowitz, M.A.

  • Author_Institution
    Comput. Syst. Lab., Stanford Univ., CA, USA
  • fYear
    1999
  • fDate
    7-11 Nov. 1999
  • Firstpage
    580
  • Lastpage
    583
  • Abstract
    State space techniques have proven to be useful for measuring and improving the coverage of test vectors that are used during functional validation via simulation. By comparing the state and edge coverage provided by tests with that which is possible in the design´s state graph, the designer can estimate how well tested the design is and identify areas that need better testing. Unfortunately, for many interesting designs, the full state graph may be too large to fully explore, or if it is explorable, the resulting coverage may be so low as to provide limited feedback. Several techniques have been proposed that identify and work with an interesting subset of the design´s state machines, but they still require computing the full state graph before projecting it. In this paper we discuss projection directed state exploration, in which a projection from the full graph is found while exploring only the relevant portion of the full graph. Even with this limited exploration, BDD size blowup is still a problem. To deal with this, we have also developed several interactive tools that provide feedback to the designer, and allow them to add hints to help with the exploration.
  • Keywords
    feedback; logic simulation; logic testing; state-space methods; coverage analysis; edge coverage; functional validation; interactive tools; large designs; projection directed state exploration; simulation; state space techniques; test generation; Binary decision diagrams; Computational modeling; Computer simulation; Explosions; Laboratories; Space exploration; State estimation; State feedback; State-space methods; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 1999. Digest of Technical Papers. 1999 IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA, USA
  • ISSN
    1092-3152
  • Print_ISBN
    0-7803-5832-5
  • Type

    conf

  • DOI
    10.1109/ICCAD.1999.810714
  • Filename
    810714