DocumentCode
3388536
Title
Improving coverage analysis and test generation for large designs
Author
Bergmann, J.P. ; Horowitz, M.A.
Author_Institution
Comput. Syst. Lab., Stanford Univ., CA, USA
fYear
1999
fDate
7-11 Nov. 1999
Firstpage
580
Lastpage
583
Abstract
State space techniques have proven to be useful for measuring and improving the coverage of test vectors that are used during functional validation via simulation. By comparing the state and edge coverage provided by tests with that which is possible in the design´s state graph, the designer can estimate how well tested the design is and identify areas that need better testing. Unfortunately, for many interesting designs, the full state graph may be too large to fully explore, or if it is explorable, the resulting coverage may be so low as to provide limited feedback. Several techniques have been proposed that identify and work with an interesting subset of the design´s state machines, but they still require computing the full state graph before projecting it. In this paper we discuss projection directed state exploration, in which a projection from the full graph is found while exploring only the relevant portion of the full graph. Even with this limited exploration, BDD size blowup is still a problem. To deal with this, we have also developed several interactive tools that provide feedback to the designer, and allow them to add hints to help with the exploration.
Keywords
feedback; logic simulation; logic testing; state-space methods; coverage analysis; edge coverage; functional validation; interactive tools; large designs; projection directed state exploration; simulation; state space techniques; test generation; Binary decision diagrams; Computational modeling; Computer simulation; Explosions; Laboratories; Space exploration; State estimation; State feedback; State-space methods; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design, 1999. Digest of Technical Papers. 1999 IEEE/ACM International Conference on
Conference_Location
San Jose, CA, USA
ISSN
1092-3152
Print_ISBN
0-7803-5832-5
Type
conf
DOI
10.1109/ICCAD.1999.810714
Filename
810714
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