Title :
8-96 GHz on-wafer network analysis
Author :
Yu, R.Y. ; Pusl, J. ; Konishi, Y. ; Case, M. ; Kamegawa, M. ; Rodwell, M.
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
Abstract :
A millimeter-wave vector network analyzer is implemented with a monolithic GaAs directional time-domain reflectometer integrated circuit mounted directly on a microwave wafer probe. The vector network analyzer performs on-wafer network analysis up to 96 GHz with +or-1 dB accuracy.<>
Keywords :
MMIC; integrated circuit testing; network analysers; probes; time-domain reflectometry; 8 to 96 GHz; GaAs; MMIC; directional time-domain reflectometer; microwave wafer probe; millimeter-wave vector network analyzer; on-wafer network analysis; Bandwidth; Distributed parameter circuits; Gallium arsenide; Impedance; Millimeter wave technology; Sampling methods; Schottky diodes; Signal generators; Time domain analysis; Transmission line theory;
Conference_Titel :
Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 1992. Technical Digest 1992., 14th Annual IEEE
Conference_Location :
Miami Beach, FL, USA
Print_ISBN :
0-7803-0773-9
DOI :
10.1109/GAAS.1992.247219
