• DocumentCode
    3388611
  • Title

    Ultraviolet light emitting diodes based on hydrothermal grown crystalline n-ZnO on p-GaN film

  • Author

    Yung-Chun Tu ; Shui-Jinn Wang ; Tseng-Hsing Lin ; Chien-Hsiung Hung ; Cheng-Han Wu ; Zong-Sian You

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • fYear
    2015
  • fDate
    21-24 June 2015
  • Firstpage
    167
  • Lastpage
    168
  • Abstract
    The growth of single crystalline ZnO film on p-GaN using the hydrothermal method is proposed and its application on n-ZnO/p-GaN heterojunction light emitting diodes (HJ-LED) is demonstrated. The effect of thermal annealing in the nitrogen ambient on the optical and electrical properties of hydrothermally grown ZnO film (HTG-ZnO film) onto a p-GaN substrate is investigated. The current-voltage (I-V) curves in darkness show that the prepared n-HTG-ZnO film/p-GaN HJ with thermal annealing has good rectifying characteristics and a 150% improvement in leakage current at -4 V has been achieved for the n-ZnO/p-GaN with thermal annealing. Strong ultraviolet lights emission from the annealed n-ZnO/p-GaN HJ-LED at around 375 nm without defect-related emissions in the visible region are observed from electroluminescence (EL) spectra.
  • Keywords
    II-VI semiconductors; III-V semiconductors; annealing; crystal growth from solution; electroluminescence; gallium compounds; leakage currents; light emitting diodes; semiconductor thin films; zinc compounds; HJ-LED; ZnO-GaN; current-voltage curves; defect-related emissions; electrical properties; electroluminescence spectra; heterojunction light emitting diodes; hydrothermal grown crystalline film; leakage current; optical properties; rectifying characteristics; thermal annealing; ultraviolet light emitting diodes; ultraviolet lights emission; visible region; voltage -4 V; Annealing; Films; Gallium nitride; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2015 73rd Annual
  • Conference_Location
    Columbus, OH
  • Print_ISBN
    978-1-4673-8134-5
  • Type

    conf

  • DOI
    10.1109/DRC.2015.7175609
  • Filename
    7175609