Title :
Ultraviolet light emitting diodes based on hydrothermal grown crystalline n-ZnO on p-GaN film
Author :
Yung-Chun Tu ; Shui-Jinn Wang ; Tseng-Hsing Lin ; Chien-Hsiung Hung ; Cheng-Han Wu ; Zong-Sian You
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Abstract :
The growth of single crystalline ZnO film on p-GaN using the hydrothermal method is proposed and its application on n-ZnO/p-GaN heterojunction light emitting diodes (HJ-LED) is demonstrated. The effect of thermal annealing in the nitrogen ambient on the optical and electrical properties of hydrothermally grown ZnO film (HTG-ZnO film) onto a p-GaN substrate is investigated. The current-voltage (I-V) curves in darkness show that the prepared n-HTG-ZnO film/p-GaN HJ with thermal annealing has good rectifying characteristics and a 150% improvement in leakage current at -4 V has been achieved for the n-ZnO/p-GaN with thermal annealing. Strong ultraviolet lights emission from the annealed n-ZnO/p-GaN HJ-LED at around 375 nm without defect-related emissions in the visible region are observed from electroluminescence (EL) spectra.
Keywords :
II-VI semiconductors; III-V semiconductors; annealing; crystal growth from solution; electroluminescence; gallium compounds; leakage currents; light emitting diodes; semiconductor thin films; zinc compounds; HJ-LED; ZnO-GaN; current-voltage curves; defect-related emissions; electrical properties; electroluminescence spectra; heterojunction light emitting diodes; hydrothermal grown crystalline film; leakage current; optical properties; rectifying characteristics; thermal annealing; ultraviolet light emitting diodes; ultraviolet lights emission; visible region; voltage -4 V; Annealing; Films; Gallium nitride; X-ray scattering;
Conference_Titel :
Device Research Conference (DRC), 2015 73rd Annual
Conference_Location :
Columbus, OH
Print_ISBN :
978-1-4673-8134-5
DOI :
10.1109/DRC.2015.7175609