• DocumentCode
    3388647
  • Title

    Statistical characteristics of electrical breakdown in saturated superfluid helium

  • Author

    Suehiro, J. ; Ohno, K. ; Takahashi, T. ; Miyama, M. ; Hara, M.

  • Author_Institution
    Dept. of Electr. Eng., Kyushu Univ., Fukuoka, Japan
  • fYear
    1996
  • fDate
    15-19 Jul 1996
  • Firstpage
    320
  • Lastpage
    323
  • Abstract
    Superfluid liquid helium (HeII) with a lower temperature than 2 K is an attractive coolant for large high field superconducting magnets because it has far better heat transfer properties and increases critical current of superconductor. This paper deals with electrical breakdown characteristics of saturated HeII at 1.85 K and the statistical analysis based on the Weibull distribution function and the Weak-link theory. A special attention is paid to the size effects on the breakdown characteristics. Comparing the obtained results with those of normal liquid helium (HeI), it is shown that the dc breakdown strength of HeII is much more sensitive to the electrode area than HeI. Consideration on the breakdown time lag under a pulsed stress reveals that the breakdown triggering electron is produced by field emission from the cathode surface as in the case of HeI
  • Keywords
    Weibull distribution; dielectric liquids; electric breakdown; superfluid helium-4; 1.85 K; DC electrical breakdown; He; He II; Weibull distribution function; cathode surface; coolant; critical current; field emission; heat transfer; pulsed stress; saturated superfluid helium; size effect; statistical analysis; superconducting magnet; time lag; triggering electron; weak-link; Coolants; Critical current; Electric breakdown; Heat transfer; Helium; Magnetic properties; Statistical analysis; Superconducting magnets; Temperature; Weibull distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Conduction and Breakdown in Dielectric Liquids, 1996, ICDL '96., 12th International Conference on
  • Conference_Location
    Roma
  • Print_ISBN
    0-7803-3560-0
  • Type

    conf

  • DOI
    10.1109/ICDL.1996.565496
  • Filename
    565496