Title :
Characterization of RF Devices using Two-Tone Probe Signals
Author :
Martone, Anthony F. ; Delp, Edward J.
Author_Institution :
School of Electrical and Computer Engineering, Purdue University, West Lafayette, Indiana
Abstract :
This paper describes a method for forensic characterization of RF devices using two-tone probe signals. When transmitted to an RF device, the two-tone signal is affected by nonlinear circuit components such as amplifiers or diodes. The nonlinear components cause intermodulation distortion to the input signal, which is reradiated by the device. Features of the intermodulation distortion products are used to construct a device fingerprint. The fingerprint is then used to characterize the device so that it can be identified from other RF devices.
Keywords :
Diodes; Fingerprint recognition; Forensics; Intermodulation distortion; Nonlinear circuits; Probes; RF signals; Radio frequency; Radiofrequency amplifiers; Radiofrequency identification; Circuit Models; Forensic Characterization; Intermodulation Distortion; Probe Signals; RF Devices;
Conference_Titel :
Statistical Signal Processing, 2007. SSP '07. IEEE/SP 14th Workshop on
Conference_Location :
Madison, WI, USA
Print_ISBN :
978-1-4244-1198-6
Electronic_ISBN :
978-1-4244-1198-6
DOI :
10.1109/SSP.2007.4301239
