DocumentCode :
3388708
Title :
A new algorithm of global feature matching based on triangle regions for image registration
Author :
Liu, Zhaoxia ; An, Jubai
Author_Institution :
Inf. Sci. & Technol. Coll., Dalian Maritime Univ., Dalian, China
fYear :
2010
fDate :
24-28 Oct. 2010
Firstpage :
1248
Lastpage :
1251
Abstract :
Feature matching is a crucial and challenging process in feature-based image registration. Mismatch is always inevitable in image registration for the feature matching methods that just use local features, no matter how powerful the discrimination of the feature point descriptor is. To solve this problem, in this paper, relative moment affine invariants are used to compare the similarity of two triangles, then a new global feature matching method is proposed to match the feature points accurately based on graph structure. In the point matching process, Genetic Algorithm is applied to find two most similar graphs that are constructed by the corresponding survivor points from two images. The proposed algorithm can deal with images of affine transformation, large scale and low overlap. Compared with traditional Iterative Closest Point (ICP), normalized cross-correlation (NCC) and Coherent Point Drift (CPD), which register aerial images captured on the sea, the proposed algorithm works well with high accuracy and stability even when the point sets have a lot of outliers.
Keywords :
affine transforms; feature extraction; genetic algorithms; image matching; image registration; iterative methods; aerial images; affine transformation; coherent point drift; feature based image registration triangle region; genetic algorithm; global feature matching method; graph structure; iterative closest point; normalized cross correlation; Accuracy; Correlation; Gallium; Image edge detection; Image registration; Iterative closest point algorithm; Noise; global feature matching; graph structure; image registration; triangulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal Processing (ICSP), 2010 IEEE 10th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-5897-4
Type :
conf
DOI :
10.1109/ICOSP.2010.5654963
Filename :
5654963
Link To Document :
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