• DocumentCode
    3388759
  • Title

    Spur reduction in wideband PLLs by random positioning of charge pump current pulses

  • Author

    Thambidurai, Chembiyan ; Krishnapura, Nagendra

  • Author_Institution
    Dept. of Electr. Eng., Indian Inst. of Technol., Chennai, India
  • fYear
    2010
  • fDate
    May 30 2010-June 2 2010
  • Firstpage
    3397
  • Lastpage
    3400
  • Abstract
    Charge pump PLL is prone to reference spurs due to non-idealities like feedthrough, charge pump current mismatch and loop filter leakage. To resolve the problem of reference spurs, a randomization technique that converts the spurs to wideband noise is proposed. The added wideband noise has insignificant contribution to the output phase noise inside the PLL bandwidth. Analytical expressions are derived to study the effect of the randomization on the output phase noise. A 1 GHz output frequency PLL with a bandwidth of 1 MHz and a 20 MHz reference frequency is simulated to test the idea. From the simulated results we could see a spur reduction of 20 dB in the nominal case. The settling time of the simulated PLL measured for a 25.2 ppm settling error is 4.5 μs.
  • Keywords
    charge pump circuits; phase locked loops; PLL; charge pump current mismatch; charge pump current pulses; frequency 1 GHz; frequency 1 MHz; frequency 20 MHz; loop filter leakage; output phase noise; spur reduction; time 4.5 mus; wideband phase locked loops; Bandwidth; Charge pumps; Filters; Phase frequency detector; Phase locked loops; Phase noise; Steady-state; Switches; Voltage-controlled oscillators; Wideband;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-5308-5
  • Electronic_ISBN
    978-1-4244-5309-2
  • Type

    conf

  • DOI
    10.1109/ISCAS.2010.5537876
  • Filename
    5537876