DocumentCode
3388759
Title
Spur reduction in wideband PLLs by random positioning of charge pump current pulses
Author
Thambidurai, Chembiyan ; Krishnapura, Nagendra
Author_Institution
Dept. of Electr. Eng., Indian Inst. of Technol., Chennai, India
fYear
2010
fDate
May 30 2010-June 2 2010
Firstpage
3397
Lastpage
3400
Abstract
Charge pump PLL is prone to reference spurs due to non-idealities like feedthrough, charge pump current mismatch and loop filter leakage. To resolve the problem of reference spurs, a randomization technique that converts the spurs to wideband noise is proposed. The added wideband noise has insignificant contribution to the output phase noise inside the PLL bandwidth. Analytical expressions are derived to study the effect of the randomization on the output phase noise. A 1 GHz output frequency PLL with a bandwidth of 1 MHz and a 20 MHz reference frequency is simulated to test the idea. From the simulated results we could see a spur reduction of 20 dB in the nominal case. The settling time of the simulated PLL measured for a 25.2 ppm settling error is 4.5 μs.
Keywords
charge pump circuits; phase locked loops; PLL; charge pump current mismatch; charge pump current pulses; frequency 1 GHz; frequency 1 MHz; frequency 20 MHz; loop filter leakage; output phase noise; spur reduction; time 4.5 mus; wideband phase locked loops; Bandwidth; Charge pumps; Filters; Phase frequency detector; Phase locked loops; Phase noise; Steady-state; Switches; Voltage-controlled oscillators; Wideband;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
Conference_Location
Paris
Print_ISBN
978-1-4244-5308-5
Electronic_ISBN
978-1-4244-5309-2
Type
conf
DOI
10.1109/ISCAS.2010.5537876
Filename
5537876
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