Title :
Identification of feedback bridging faults with oscillation
Author :
Hashizume, Masaki ; Yotsuyanagi, Hiroyuki ; Tamesada, Takeomi
Author_Institution :
Fac. of Eng., Tokushima Univ., Japan
Abstract :
When a feedback bridging fault occurs in a combinational circuit and it is activated, logical oscillation may be generated in the circuit. In this paper, the necessary conditions are presented for feedback bridging faults to generate logical oscillation. Also, a method is proposed to identify such faults in feedback bridging ones. It is based on piecewise-linearized models obtained from input/output characteristics of logic gates and does not require circuit simulation of large size of circuits to identify them. In the experiments for evaluating the method, all of the feedback bridging faults to generate logical oscillation are identified by using the method
Keywords :
CMOS logic circuits; circuit feedback; circuit oscillations; combinational circuits; fault diagnosis; integrated circuit testing; logic testing; piecewise linear techniques; CMOS process technology; combinational circuit; feedback bridging fault identification; input/output characteristics; logic gates; logical oscillation generation; piecewise-linearized models; Circuit faults; Circuit testing; Current supplies; Electrical fault detection; Fault detection; Fault diagnosis; Feedback; Frequency estimation; Logic circuits; Logic testing;
Conference_Titel :
Test Symposium, 1999. (ATS '99) Proceedings. Eighth Asian
Conference_Location :
Shanghai
Print_ISBN :
0-7695-0315-2
DOI :
10.1109/ATS.1999.810725
