Comparison of Y–Ba–Cu–O Films Irradiated With Helium and Neon Ions for the Fabricationof Josephson Devices

Author

Cybart, Shane A. ; Yen, Patricia X. T. ; Cho, Ethan Y. ; Huh, Jeong Uk ; Glyantsev, V.N. ; Yung, Christopher S. ; Moeckly, Brian ; Beeman, Jeffrey W. ; Dynes, Robert C.

Author_Institution

Dept. of Phys., Univ. of California at San Diego, La Jolla, CA, USA

Volume

24

Issue

4

fYear

2014

fDate

Aug. 2014

Firstpage

1

Lastpage

5

Abstract

We have irradiated high-quality YBa₂Cu₃O_7-δ thin films with 90-keV helium and 175-keV neon ions to compare how ions of different mass affect electrical transport and reduce superconducting transition temperature. We measure the temperature dependence of the resistivity for films irradiated with different fluence and compare the results with Monte Carlo ion implantation simulations. We observe a smaller increase in resistivity for films irradiated with neon than those irradiated with helium for an equivalent reduction in transition temperature. We attribute this observation to nonuniform damage throughout the thickness of the film when irradiated with neon, as opposed to a more uniform damage profile in the case of helium irradiation.

Keywords

barium compounds; electrical resistivity; helium; ion beam effects; neon; superconducting junction devices; superconducting thin films; superconducting transition temperature; yttrium compounds; Josephson devices; YBCO; YBCO films; damage profile; electrical transport; helium ion irradiation; high-quality thin films; neon ion irradiation; resistivity; superconducting transition temperature; temperature dependence; Conductivity; Helium; Ions; Radiation effects; Superconducting transition temperature; Temperature measurement; Yttrium barium copper oxide; Ion implantation; high temperature superconductor;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2014.2311400

Filename

6766760