Title :
On an effective selection of IDDQ measurement vectors for sequential circuits
Author :
Ichihara, Hideyuki ; Kinoshita, Kozo ; Kajihara, Seiji
Author_Institution :
Dept. of Appl. Phys., Osaka Univ., Japan
Abstract :
In IDDQ testing, it is important to reduce the number of time-consuming IDDQ measurements. Therefore, it is necessary to select a small number of IDDQ measurement vectors in a test sequence for a sequential circuit while fault coverage is nearly maximum. In this paper, we address the selection problem of measurement vectors by introducing a cost function which is defined by the number of measurement vectors and fault coverage. The proposed method for selecting measurement vectors optimizes the cost function so that high fault coverage is obtained by a small number of measurement vectors
Keywords :
CMOS logic circuits; electric current measurement; fault diagnosis; integrated circuit testing; logic testing; sequential circuits; vectors; CMOS circuits; IDDQ measurement vector selection; IDDQ testing; cost function; fault coverage; sequential circuits; test sequence; Sequential circuits;
Conference_Titel :
Test Symposium, 1999. (ATS '99) Proceedings. Eighth Asian
Conference_Location :
Shanghai
Print_ISBN :
0-7695-0315-2
DOI :
10.1109/ATS.1999.810743
