Title :
IDDQ current dependency on test vectors and bridging resistance
Author :
Keshk, Arabi ; Miura, Yukiya ; Kinoshita, Kozo
Author_Institution :
Graduate Sch. of Eng., Osaka Univ., Japan
Abstract :
In this paper, we focus on how the IDDQ current value varies depending on the test vectors and the resistance of bridging faults. Detection of a large IDDQ is easier than a small I DDQ because the value of IDDQ is normally of the order of microamperes. If suitable logic values are assigned to the faulty nodes, a small channel resistance will be obtained and then a large IDDQ will flow. We have performed the simulation to show that the value of IDDQ depends on the test vectors that applied to the faulty nodes for external and internal bridging nodes. As a result, IDDQ at the low resistance-bridging fault increased bp 26%-36% for external bridging faults between different gates. For the internal bridging fault between any gates, the increased IDDQ is 27%-159% for all resistive bridging faults
Keywords :
CMOS digital integrated circuits; SPICE; automatic test pattern generation; electric current measurement; fault simulation; integrated circuit testing; logic testing; vectors; CMOS circuits; IDDQ current dependence; PSPICE simulation; bridging faults; bridging resistance; external bridging nodes; fault simulation; faulty nodes; internal bridging nodes; small channel resistance; test vectors; Circuit faults; Circuit simulation; Circuit testing; Current measurement; Current supplies; Logic testing; Power measurement; Power supplies; Steady-state; System testing;
Conference_Titel :
Test Symposium, 1999. (ATS '99) Proceedings. Eighth Asian
Conference_Location :
Shanghai
Print_ISBN :
0-7695-0315-2
DOI :
10.1109/ATS.1999.810745
