IDDQ current dependency on test vectors and bridging resistance

In this paper, we focus on how the I_DDQ current value varies depending on the test vectors and the resistance of bridging faults. Detection of a large I_DDQ is easier than a small I _DDQ because the value of I_DDQ is normally of the order of microamperes. If suitable logic values are assigned to the faulty nodes, a small channel resistance will be obtained and then a large I_DDQ will flow. We have performed the simulation to show that the value of I_DDQ depends on the test vectors that applied to the faulty nodes for external and internal bridging nodes. As a result, I_DDQ at the low resistance-bridging fault increased bp 26%-36% for external bridging faults between different gates. For the internal bridging fault between any gates, the increased I_DDQ is 27%-159% for all resistive bridging faults