Genetic algorithm based test generation for sequential circuits

Author

Shen, Li

Author_Institution

Inst. of Comput. Technol., Acad. Sinica, Beijing, China

fYear

1999

fDate

1999

Firstpage

179

Lastpage

184

Abstract

This paper deals with simulation and genetic algorithm (GA) based test generation for sequential circuits. We proposed a new sequential depth measure called sequential element reachability, which may be used as one of the parameters of the GA. For fitness functions, we propose a new dynamic testability measure, which can be evaluated in parallel for multiple individuals. The test generation is divided to three sub-problems: initialization, test vector generation for a group of faults and test sequence generation for a target fault. Using ISCAS89 benchmarks, experimental results for the GA are given

Keywords

automatic test pattern generation; circuit optimisation; fault simulation; flip-flops; genetic algorithms; integrated circuit testing; logic simulation; logic testing; sequential circuits; ATPG; ISCAS89 benchmarks; dynamic testability measure; fault simulation; fitness functions; flip-flops; genetic algorithm based test generation; initialization; logic simulation; parallel evaluation; sequential circuits; sequential depth measure; sequential element reachability; test sequence generation; test vector generation; Automatic test pattern generation; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computers; Genetic algorithms; Sequential analysis; Sequential circuits; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 1999. (ATS '99) Proceedings. Eighth Asian

Conference_Location

Shanghai

ISSN

1081-7735

Print_ISBN

0-7695-0315-2

Type

conf

DOI

10.1109/ATS.1999.810748

Filename

810748