Title :
Analog metrology and stimulus selection in a noisy environment
Author :
Su, Chauchin ; Chen, Yue-Tsang ; Lee, Chung-Len
Author_Institution :
Dept. of Electr. Eng., Nat. Central Univ., Chung-Li, Taiwan
Abstract :
In this paper an analog metrology and test stimulus selection guidelines are proposed based on the frequency domain analysis of the stimulus and the CUT. To show the feasibility, a 4th order leapfrog filter and a DSP deconvolution operation are used as the test vehicle. The experimental results on the real measured data show that the increase in observation periods can effectively compensate the increase in the environment noise
Keywords :
active filters; analogue integrated circuits; deconvolution; frequency-domain analysis; integrated circuit measurement; integrated circuit testing; noise; 4th order leapfrog filter; DSP deconvolution operation; amplitude response; analog metrology; environment noise; frequency domain analysis; noisy environment; phase response; stimulus selection guidelines; test stimulus; Deconvolution; Digital signal processing; Filters; Frequency domain analysis; Guidelines; Metrology; Noise measurement; Testing; Vehicles; Working environment noise;
Conference_Titel :
Test Symposium, 1999. (ATS '99) Proceedings. Eighth Asian
Conference_Location :
Shanghai
Print_ISBN :
0-7695-0315-2
DOI :
10.1109/ATS.1999.810756
