Analog metrology and stimulus selection in a noisy environment

Author

Su, Chauchin ; Chen, Yue-Tsang ; Lee, Chung-Len

Author_Institution

Dept. of Electr. Eng., Nat. Central Univ., Chung-Li, Taiwan

fYear

1999

fDate

1999

Firstpage

233

Lastpage

238

Abstract

In this paper an analog metrology and test stimulus selection guidelines are proposed based on the frequency domain analysis of the stimulus and the CUT. To show the feasibility, a 4th order leapfrog filter and a DSP deconvolution operation are used as the test vehicle. The experimental results on the real measured data show that the increase in observation periods can effectively compensate the increase in the environment noise

Keywords

active filters; analogue integrated circuits; deconvolution; frequency-domain analysis; integrated circuit measurement; integrated circuit testing; noise; 4th order leapfrog filter; DSP deconvolution operation; amplitude response; analog metrology; environment noise; frequency domain analysis; noisy environment; phase response; stimulus selection guidelines; test stimulus; Deconvolution; Digital signal processing; Filters; Frequency domain analysis; Guidelines; Metrology; Noise measurement; Testing; Vehicles; Working environment noise;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 1999. (ATS '99) Proceedings. Eighth Asian

Conference_Location

Shanghai

ISSN

1081-7735

Print_ISBN

0-7695-0315-2

Type

conf

DOI

10.1109/ATS.1999.810756

Filename

810756

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3389409