DocumentCode :
3389435
Title :
An experimental assessment of compact thermal models for the prediction of board-mounted electronic component heat transfer
Author :
Eveloy, Valérie ; Rodgers, Peter ; DeVoe, Jason ; Ortega, Alfonso ; Hashmi, M.S.J
Author_Institution :
Electron. Thermal Manage. Ltd., Co. Mayo, Ireland
fYear :
2003
fDate :
11-13 March 2003
Firstpage :
300
Lastpage :
312
Abstract :
The predictive performance of component compact thermal models (CTMs) implemented in a computational fluid dynamics (CFD) code is assessed for the analysis of board-mounted electronic component heat transfer. This is achieved by comparing numerical predictions with experimental measurements of component junction temperature and component-PCB surface temperature, measured using thermal test chips and infrared thermography respectively. The test vehicles consist of two different package types (SO8 and PQFP208), individually mounted on different printed circuit board (PCB) constructions, which were thermally characterized in a range of convective environments. Component and board detailed modeling are based on nominal dimensions and material properties. A systematic approach is employed to permit potential sources of predictive discrepancies to be isolated. Using a detailed component modeling approach, component junction temperature predictive accuracy was overall within ±3°C or 5% of measurement, demonstrating the robustness of the detailed component and board modeling methodologies. Using star-shaped and shunted resistor network-based CTMs, predictive accuracy was found to decay by 7% to 20% relative to the detailed component models. The coupling of the CTM to the board was shown to impact on predictive accuracy, and suggestions were made to improve CTM implementation in the CFD code.
Keywords :
computational fluid dynamics; convection; heat transfer; infrared imaging; integrated circuit modelling; printed circuits; thermal management (packaging); CFD; CTM; board-mounted electronic component heat transfer; compact thermal models; component junction temperature predictive accuracy; component-PCB surface temperature; computational fluid dynamics; convective environments; infrared thermography; shunted resistor network-based CTM; star-shaped network-based CTM; thermal characterization; thermal test chips; Accuracy; Circuit testing; Computational fluid dynamics; Electronic components; Electronic packaging thermal management; Heat transfer; Performance analysis; Predictive models; Semiconductor device measurement; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 2003. Ninteenth Annual IEEE
ISSN :
1065-2221
Print_ISBN :
0-7803-7793-1
Type :
conf
DOI :
10.1109/STHERM.2003.1194377
Filename :
1194377
Link To Document :
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