Title :
Identification of redundant crosspoint faults in sequential PLAs with fault-free hardware reset
Author :
Yamada, Teruhiko ; Kotake, Toshinori ; Takahashi, Hiroshi ; Yamazaki, Koji
Author_Institution :
Dept. of Comput. Sci., Meiji Univ., Kawasaki, Japan
Abstract :
We present a technique for identifying redundant crosspoint faults in, sequential PLAs with fault-free hardware reset. This technique can find most redundant crosspoint faults efficiently. Experimental results show that about 7% of crosspoint faults are redundant on an average in the sequential PLAs synthesized by a commercial design tool SYNARIO for MCNC LGSynth89 finite-state machine benchmarks
Keywords :
circuit analysis computing; design for testability; fault simulation; integrated circuit testing; logic testing; programmable logic arrays; redundancy; sequential circuits; FSM benchmarks; SYNARIO; fault identification; fault-free hardware reset; finite-state machine benchmarks; redundant crosspoint faults; sequential PLAs; Benchmark testing; Circuit faults; Circuit synthesis; Circuit testing; Decoding; Fault diagnosis; Hardware; Programmable logic arrays; Sequential analysis; Sequential circuits;
Conference_Titel :
Test Symposium, 1999. (ATS '99) Proceedings. Eighth Asian
Conference_Location :
Shanghai
Print_ISBN :
0-7695-0315-2
DOI :
10.1109/ATS.1999.810762
