Title :
A new algorithm for retiming-based partial scan
Author :
Huang, Zulan ; Ye, Yizheng ; Mao, Zhigang
Author_Institution :
Microelectron. Center, Harbin Inst. of Technol., China
Abstract :
In this paper, a new algorithm for retiming-based partial scan is presented. The proposed technique achieves a good-for-test configuration by moving registers to a specific set of edges that is selected for scan. As a part of our work, an algorithm of counting how many cycles that contain a specific edge is given. Moreover, the validity to place some registers on a definite set of edges by retiming is also discussed. Comparing with the existed retiming-based methods, our approach is characterized by less area overhead and comparable fault coverage. Experimental results of some ISCAS´89 benchmarks showed the effectiveness of our method
Keywords :
boundary scan testing; circuit analysis computing; flip-flops; graph theory; integrated circuit testing; logic testing; timing; area overhead reduction; fault coverage; good-for-test configuration; retiming-based partial scan; Automatic testing; Circuit faults; Circuit testing; Electronic switching systems; Feedback; Flip-flops; Microelectronics; Registers; Sequential analysis; Sequential circuits;
Conference_Titel :
Test Symposium, 1999. (ATS '99) Proceedings. Eighth Asian
Conference_Location :
Shanghai
Print_ISBN :
0-7695-0315-2
DOI :
10.1109/ATS.1999.810771