Title :
Practical application of automated fault diagnosis for stuck-at, bridging, and measurement condition dependent faults in fully scanned sequential circuits
Author :
Shimoda, Reisuke ; Yoshida, Takaki ; Watari, Masafumi ; Toyota, Yasuhiro ; Nishi, Kiyokazu ; Motohara, Akira
Author_Institution :
Matsushita Electr. Ind. Co. Ltd., Japan
Abstract :
A practical fault diagnosis system based on combination automatic test pattern generation (ATPG) and fault simulation is described. Our fault diagnosis system deals with conventional stuck-at and bridging faults, as well as measurement condition dependent (MCD) faults in order to diagnose those faults causing different behavior with measurement condition such as supply voltage and temperature, using single stuck-at based diagnosis techniques. Experimental results with a practical very deep submicron (VDSM) LSI circuit shows that a defective chip can be efficiently diagnosed using our diagnostic algorithm and newly proposed MCD fault model
Keywords :
automatic test pattern generation; fault diagnosis; fault simulation; integrated circuit testing; integrated logic circuits; large scale integration; logic testing; sequential circuits; automated fault diagnosis; automatic test pattern generation; bridging faults; combination ATPG; diagnostic algorithm; fault diagnosis system; fault model; fault simulation; fully scanned sequential circuits; measurement condition dependent faults; stuck-at faults; supply voltage; temperature; very deep submicron LSI circuit; Automatic test pattern generation; Circuit faults; Circuit simulation; Circuit testing; Dictionaries; Fault diagnosis; Fault location; Large scale integration; Pattern matching; Sequential circuits;
Conference_Titel :
Test Symposium, 1999. (ATS '99) Proceedings. Eighth Asian
Conference_Location :
Shanghai
Print_ISBN :
0-7695-0315-2
DOI :
10.1109/ATS.1999.810774
