DocumentCode :
3389928
Title :
Measurement of Gain Curves for Semiconductor Optical Amplifier Utilizing Hakki-Paoli Method With Wavelet Denoise and Deconvolution Process
Author :
Liu, Lei ; Zhang, Xinliang ; Huang, Dexiu
Author_Institution :
Wuhan Nat. Lab. for Optoelectron., Huazhong Univ. of Sci. & Technol., Wuhan
fYear :
2006
fDate :
Nov. 2006
Firstpage :
63
Lastpage :
66
Abstract :
For improved the precision of the measurement result of the gain coefficient and avoid the affection of the optical spectrum analyzer´s resolution and noise, we combined the Hakki-Paoli method with the wavelet denoise and deconvolution process. It was testified from the simulation that this method improve the precision of the gain coefficient measurement. At last, the conclusion was testified from the experiment
Keywords :
deconvolution; laser beams; laser noise; laser variables measurement; semiconductor optical amplifiers; spectral analysers; spectral analysis; wavelet transforms; Hakki-Paoli method; deconvolution process; gain coefficient; gain curves measurement; optical spectrum analyzer resolution; semiconductor optical amplifier; wavelet denoise; Deconvolution; Gain measurement; Noise measurement; Optical noise; Optical sensors; Semiconductor device noise; Semiconductor lasers; Semiconductor optical amplifiers; Spontaneous emission; Wavelet analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optoelectronics, 2006 Optics Valley of China International Symposium on
Conference_Location :
Wuhan
Print_ISBN :
1-4244-0816-4
Type :
conf
DOI :
10.1109/OVCISO.2006.302713
Filename :
4085575
Link To Document :
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