• DocumentCode
    3389993
  • Title

    State-of-the-art and future directions of high-performance all-digital frequency synthesis in nanometer CMOS

  • Author

    Staszewski, Robert Bogdan

  • Author_Institution
    Dept. of Microelectron./DIMES, Tech. Univ. Delft, Delft, Netherlands
  • fYear
    2010
  • fDate
    May 30 2010-June 2 2010
  • Firstpage
    229
  • Lastpage
    232
  • Abstract
    The past several years have successfully brought all-digital techniques to the RF frequency synthesis, which could arguably be considered one of the last strong bastions of the traditionally-analog design approaches. With their high sensitivity and high dynamic range requirements, the RF circuits have long had a good excuse to avoid any possible source of digital switching activity. With the constant scaling of CMOS feature size and the merciless push for integration, the existence of almost free and powerful digital logic could not go unnoticed. Hence, the environment was ripe to transform the RF functions into digital realizations, as well as to apply digital assistance to help with the performance of RF circuits. This paper revisits the digitization journey of the traditional charge-pump PLL and offers a few novel techniques to further improve area, current consumption, testability and reliability of frequency synthesizers.
  • Keywords
    CMOS digital integrated circuits; charge pump circuits; circuit reliability; frequency synthesizers; nanoelectronics; phase locked loops; radiofrequency integrated circuits; RF frequency synthesis; analog design approach; charge-pump PLL; digital logic; digital switching; high-performance all-digital frequency synthesis reliability; nanometer CMOS; Charge pumps; Digital filters; Frequency synthesizers; Phase detection; Phase frequency detector; Phase locked loops; Radio frequency; TV; Tuning; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-5308-5
  • Electronic_ISBN
    978-1-4244-5309-2
  • Type

    conf

  • DOI
    10.1109/ISCAS.2010.5537937
  • Filename
    5537937