Title :
Expanding the V-Modell® XT for verification and validation of modelling and simulation applications
Author :
Wang, Zhongshi ; Lehmann, Axel
Author_Institution :
Inst. fur Tech. Intelligenter Syst. (ITIS), Univ. der Bundeswehr Munchen, Neubiberg
Abstract :
Conducting verification and validation (V&V) of modelling and simulation (M&S) applications requires structured and standardized processes. A variety of V&V processes has been already proposed within the M&S community to facilitate the quality assurance efforts. Many of them are, however, either too abstract to be directly applied for practical use, or closely coupled with particular model development processes, which are unfortunately not commonly accepted. The V-Modell XT is the new German standard IT development process obligatory for federal administration and defense engineering projects, and currently also obtains increasing acceptance of commercial IT enterprises. This paper discusses the potential of using the V-Modell XT for an M&S project. Since the V-Modell does not contain all essential aspects required for a simulation project, the M&S-specific components should be additionally defined and integrated. This work presents a lightweight approach to enabling the introduction of the V-Modell for developing M&S applications and conducting their V&V, without modifying the existing elements.
Keywords :
digital simulation; formal specification; formal verification; software quality; V-Modell XT; commercial IT enterprises; modelling applications validation; modelling applications verification; quality assurance; simulation applications validation; simulation applications verification; Concrete; Documentation; Guidelines; Intelligent structures; Intelligent systems; Project management; Quality assurance; Quality management; Standards development; Trademarks; Modelling and Simulation (M&S); Verification and Validation (V&V); the V-Modell XT;
Conference_Titel :
System Simulation and Scientific Computing, 2008. ICSC 2008. Asia Simulation Conference - 7th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-1786-5
Electronic_ISBN :
978-1-4244-1787-2
DOI :
10.1109/ASC-ICSC.2008.4675394