Total ionizing dose radiation characterization of the Natel HSRD1056RH resolver-to-digital converter hybrid

Author

Lee, C.I. ; Hill, R.E. ; Nies, K.

Author_Institution

Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA

fYear

1992

fDate

1992

Firstpage

48

Lastpage

52

Abstract

The total ionizing dose (TID) test of the Natel HSRD1056RH synchro/resolver-to-digital converter for the space environment has been completed using the ⁶⁰Co source at JPL. A classical ´rebound´ effect was observed during time dependent effects (TDE) test due to slight parametric drifts of the internal CMOS circuitry. Circuit analysis suggested a ´quick fix´ to this sensitivity which was verified by testing of modified devices. The large conversion error was found due to the high frequency, rather than the ionizing dose radiation.

Keywords

aerospace computer control; aerospace instrumentation; aerospace simulation; analogue-digital conversion; attitude control; gamma-ray effects; radiation hardening (electronics); synchros; Cassini spacecraft; Natel HSRD1056RH; conversion error; internal CMOS circuitry; parametric drifts; resolver-to-digital converter hybrid; space control systems; space environment; time dependent effects; total ionizing dose radiation characterization; Aerospace electronics; Analog-digital conversion; Circuit testing; Control systems; Ionizing radiation; Laboratories; Propulsion; Space technology; Transducers; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation Effects Data Workshop, 1992. Workshop Record., 1992 IEEE

Conference_Location

New Orleans, LA, USA

Print_ISBN

0-7803-0930-8

Type

conf

DOI

10.1109/REDW.1992.247325

Filename

247325