Radiation pre-screening of R3000/R3000A microprocessors

Author

Harboe-Sorensen, R. ; Sund, A.T.

Author_Institution

ESA/ESTEC, Noordwijk, Netherlands

fYear

1992

fDate

1992

Firstpage

34

Lastpage

41

Abstract

For the Hermes project, a radiation pre-screening program was carried out on nine types of R3000/R3000A RISC microprocessors and four types of R3010A co-processors. Results from this program which cover Single Event Upset/Latch-up (SEU/SEL) testing using Cf-252, heavy ion and proton simulation sources, and total ionising dose testing using a Co-60 source, are presented. Expected in-orbit upset rates, based on the SEU ground test data and the CREME suite of programs, are calculated for two Hermes orbits, 460 km/28.5 degrees and 450 km/64.8 degrees .

Keywords

aerospace instrumentation; aerospace simulation; gamma-ray effects; integrated circuit testing; ion beam effects; microprocessor chips; proton effects; radiation hardening (electronics); reduced instruction set computing; CREME programs; Hermes project; R3000 microprocessor; R3000A microprocessor; R3010A co-processors; RISC microprocessors; SEU testing; gamma-ray irradiation; ground test data; heavy ion testing; in-orbit upset rates; latch-up testing; proton testing; radiation pre-screening; space electronics; total ionising dose testing; Automatic testing; Circuit testing; Electronics packaging; Large scale integration; Logic; Microprocessors; National electric code; Registers; Software testing; Vehicle crash testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation Effects Data Workshop, 1992. Workshop Record., 1992 IEEE

Conference_Location

New Orleans, LA, USA

Print_ISBN

0-7803-0930-8

Type

conf

DOI

10.1109/REDW.1992.247327

Filename

247327