DocumentCode
3390192
Title
Workshop Record 1992 IEEE Radiation Effects Data Workshop (Cat. No.92TH0507-4)
fYear
1992
fDate
14-14 July 1992
Abstract
Presents the cover from the proceedings of this conference.
Keywords
VLSI; aerospace instrumentation; aerospace simulation; digital integrated circuits; integrated circuit testing; radiation effects; radiation hardening (electronics); space vehicles; CMOS circuits; memories; microprocessors; radiation effects data; radiation hardened circuits; related part types; single part types; single-event phenomena;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 1992. Workshop Record., 1992 IEEE
Conference_Location
New Orleans, LA, USA
Print_ISBN
0-7803-0930-8
Type
conf
DOI
10.1109/REDW.1992.247333
Filename
247333
Link To Document