Title :
Multiferroic and structural transition properties of Bi1−xPrxFe0.95Mn0.05O3 thin films
Author :
Hone-Zern Chen ; Ming-Cheng Kao ; San-Lin Young
Author_Institution :
Dept. of Electron. Eng., Hsiuping Univ. of Sci. & Technol., Taichung, Taiwan
Abstract :
Bi1-xPrxFe0.95Mn0.05O3 (BPFMO) thin films were successfully deposited on Pt(111)/Ti/SiO2/Si(100) substrates by spin coating with a sol-gel technology and rapid thermal annealing. The effects of Pr content on the microstructure, magnetic and multiferroic properties of thin films were investigated. The result of X-ray diffraction analysis shows that the BPFMO thin films have rhombohedral-to-tetragonal R3c→P4mm phase transition at x = 0.15. The Pr doping on the A-site of BiFeO3 could induce the appearance of the spontaneous magnetization and polarization by the phase transition of rhombohedral-to-tetragonal. The BPFMO thin films with x = 0.2 exhibits the maximum remanent magnetization (2Mr) of 0.44 emu/g.
Keywords :
X-ray diffraction; bismuth compounds; doping; ferrites; magnetic thin films; multiferroics; praseodymium compounds; rapid thermal annealing; remanence; sol-gel processing; solid-state phase transformations; spin coating; spontaneous magnetisation; Bi1-xPrxFe0.95Mn0.05O3; X-ray diffraction; doping; magnetic properties; microstructural properties; multiferroic properties; rapid thermal annealing; remanent magnetization; rhombohedral-tetragonal phase transition; sol-gel technology; spin coating; spontaneous magnetization; structural transition properties; thin films; Bismuth; Films; Ions; Magnetic hysteresis; Magnetic properties; Substrates; X-ray diffraction; Bismuth ferrite; Magnetic; Phase transition; Sol-gel process;
Conference_Titel :
Nanoelectronics Conference (INEC), 2013 IEEE 5th International
Conference_Location :
Singapore
Print_ISBN :
978-1-4673-4840-9
Electronic_ISBN :
2159-3523
DOI :
10.1109/INEC.2013.6466016
