DocumentCode :
3390406
Title :
Improving redundancy addition and removal using unreachable states for sequential circuits
Author :
Yang, Xiaoqing ; Xiao, Zigang ; Wu, Y.L.
Author_Institution :
Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Hong Kong, China
fYear :
2010
fDate :
May 30 2010-June 2 2010
Firstpage :
3172
Lastpage :
3175
Abstract :
Redundancy Addition and Removal (RAR), one of the major combinational logic perturbation techniques, has been shown to be very useful for many EDA optimization tasks. However, all the currently known RAR techniques did not analyze and make use of unreachable states, which are abundant in sequential circuits. These unreachable states can be considered as input don´t cares and can add an extra flexibility in locating alternative wires. In this paper, we study the fundamental theory and propose a reasoning scheme for locating alternative wires without performing wasteful redundancy tests. To explore the deeper effect of unreachable states, the concept is extended to illegal assignments and the fault independent redundancy identification is applied on illegal assignments to find flexibilities introduced by unreachable states. On the experiments carried for both MCNC and industry benchmarks, it is shown that using such an idea, a remarkable increase of more than 100% (averagely) in the number of alternative wires can be found, which should be quite useful as most of today´s practical circuits are sequential.
Keywords :
combinatorial mathematics; redundancy; sequential circuits; EDA optimization task; alternative wire; combinational logic perturbation; fault independent redundancy identification; redundancy addition and removal; redundancy test; sequential circuits; unreachable states; Circuit faults; Circuit testing; Electronic design automation and methodology; Fault diagnosis; Logic; Performance evaluation; Perturbation methods; Redundancy; Sequential circuits; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-5308-5
Electronic_ISBN :
978-1-4244-5309-2
Type :
conf
DOI :
10.1109/ISCAS.2010.5537956
Filename :
5537956
Link To Document :
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