• DocumentCode
    3390457
  • Title

    Equipment engineering systems

  • Author

    Schöbel, Eckhard

  • Author_Institution
    AIS Autom., Dresden, Germany
  • fYear
    2003
  • fDate
    31 March-1 April 2003
  • Firstpage
    195
  • Lastpage
    201
  • Abstract
    The need of the semiconductor industry for fully automated production to reduce the production time and costs makes it necessary to control all equipment remotely. To make improvements possible it is necessary to have exact data of the current state of the production for each single equipment. Because the machines are connected already to the infrastructure the collection of data can be done also fully automated by using the equipment´s information. Such a system is the TFM (Total Fab Monitoring) developed by AIS Automation GmbH. But with automating the daily work the risk is also increased if one of the systems in the architecture fails. Since the risk will ever be present the fabs need a solution to react on problems very fast. This was the reason for AIS to develop an e-diagnostic system VRC (VAC Remote Control). It is used productively in a modern fab in Dresden for supervising the equipment integration software and hardware which is the basis for the automation of the production. The paper describes these two important applications of the MES level.
  • Keywords
    computerised monitoring; diagnostic expert systems; integrated circuit manufacture; manufacturing data processing; process monitoring; semiconductor device manufacture; telecontrol; AIS Automation GmbH; Total Fab Monitoring; VAC remote control; data collection; e-diagnostic system; equipment engineering systems; fully automated production; remote control; semiconductor industry; Automatic control; Automation; Computer architecture; Computerized monitoring; Condition monitoring; Control systems; Costs; Electronics industry; Production; Systems engineering and theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference and Workshop, 2003 IEEEI/SEMI
  • ISSN
    1078-8743
  • Print_ISBN
    0-7803-7681-1
  • Type

    conf

  • DOI
    10.1109/ASMC.2003.1194492
  • Filename
    1194492