DocumentCode
3390653
Title
Reliability considerations for gas delivery components
Author
Savadkouhi, J.
Author_Institution
Mykrolis Corp., Allen, TX, USA
fYear
2003
fDate
31 March-1 April 2003
Firstpage
255
Lastpage
261
Abstract
New advances in semiconductor manufacturing are demanding higher performance levels for process equipment. Gas delivery components are critical in several semiconductor fabrication processes. Requirements for minimum downtime and low cost of ownership demand increased reliability and performance. Extended lifetime, lower cost of operation including repair and calibration, and higher performance levels are continuously demanded by tool manufacturers and end users. In addition, integration of gas components and contamination control issues add to the complexity of the new generation gas delivery systems currently under development. These developments further demand higher levels of reliability for the subsystem components. New trends in quality and reliability are forcing manufacturers to comply with stringent requirements similar to those of the aerospace industry. This paper discusses test methods and experiment to improve gas delivery components performance and reliability. Examples of gas delivery components are reviewed. Individual component reliability and the effect on the total reliability of the system are described. A test method for Mass Flow Controllers (MFC) reliability is described as an example. This method simulates actual MFC usage in a process tool over an extended period of time. Test setup, test parameters and data collection are discussed in detail. It is shown how Mean Time between Failure (MTBF) or other statistical measures may be utilized to improve system reliability.
Keywords
failure analysis; flow control; life testing; reliability; semiconductor device manufacture; accelerated life testing; cost of ownership; downtime; gas delivery component; mass flow controller; mean time between failure; process equipment; reliability; semiconductor manufacturing; Aerospace industry; Aerospace testing; Calibration; Contamination; Control systems; Costs; Fabrication; Manufacturing processes; Semiconductor device manufacture; Weight control;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference and Workshop, 2003 IEEEI/SEMI
ISSN
1078-8743
Print_ISBN
0-7803-7681-1
Type
conf
DOI
10.1109/ASMC.2003.1194503
Filename
1194503
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