DocumentCode :
3390760
Title :
Enhanced Empirical Mode Decomposition using a Novel Sifting-Based Interpolation Points Detection
Author :
Kopsinis, Yannis ; McLaughlin, Stephen Steve
Author_Institution :
IDCOM,School of Engineering and Electronics, The University of Edinburgh, King´´s Buildings, EH9 3JL, Edinburgh
fYear :
2007
fDate :
26-29 Aug. 2007
Firstpage :
725
Lastpage :
729
Abstract :
Empirical mode decomposition (EMD) is a signal analysis method which has received much attention lately due its performance in a number of applications. The main disadvantage ntage of EMD is that it is lacking a theoretical foundation and therefore, our understanding of it have come through intuition and experimental validation. This drawback has significantly limited the potential for improvements to the method itself. In other words, the version of EMD currently used by most researchers is roughly the same as that proposed 9 years ago. In this paper, a novel version of EMD is proposed which exhibits significantly improved decomposition performance. This new development exploits the results of a study on EMD concerning the optimized configuration of EMD with respect to criteria for selection of interpolation points.
Keywords :
Amplitude modulation; Equations; Frequency modulation; Interpolation; Narrowband; Polynomials; Signal analysis; Signal processing; Signal resolution; Signal decomposition; signal analysis; time-frequency analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Statistical Signal Processing, 2007. SSP '07. IEEE/SP 14th Workshop on
Conference_Location :
Madison, WI, USA
Print_ISBN :
978-1-4244-1198-6
Electronic_ISBN :
978-1-4244-1198-6
Type :
conf
DOI :
10.1109/SSP.2007.4301354
Filename :
4301354
Link To Document :
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