• DocumentCode
    3390892
  • Title

    New developments in color image tampering detection

  • Author

    Sutthiwan, Patchara ; Shi, Yun-Qing ; Dong, Jing ; Tan, Tieniu ; Ng, Tian-Tsong

  • Author_Institution
    Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ, USA
  • fYear
    2010
  • fDate
    May 30 2010-June 2 2010
  • Firstpage
    3064
  • Lastpage
    3067
  • Abstract
    In this paper, an efficient framework for passive-blind color image tampering detection is presented. Statistical features are extracted from a given test image and a set of 2-D arrays derived by applying multi-size block discrete cosine transform to the given test image. Image features are extracted from Cr channel, a chroma channel in YCbCr color space, because of its observed sensitivity to color image tampering. A support vector machine is employed to evaluate the effectiveness of image features over a color image dataset recently established for tampering detection. Boosting feature selection is applied to having feature dimensionality reduced so as to make detection accuracy generalizable and computational complexity decreased. Experimental results have demonstrated that the proposed framework applied to the aforementioned dataset outperforms the state of the arts by distinct margins.
  • Keywords
    computational complexity; feature extraction; image colour analysis; support vector machines; 2-D arrays; chroma channel; color image tampering detection; computational complexity; feature extraction; passive-blind image detection; support vector machine; Boosting; Color; Computer vision; Discrete cosine transforms; Feature extraction; Forgery; Splicing; Support vector machines; Testing; Watermarking; Markov process; boosting feature selection; color image tampering detection; moments of characteristic functions; multi-size block discrete cosine transform; support vector machine;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-5308-5
  • Electronic_ISBN
    978-1-4244-5309-2
  • Type

    conf

  • DOI
    10.1109/ISCAS.2010.5537980
  • Filename
    5537980