• DocumentCode
    3391179
  • Title

    Accurate detection of out-of-control variations from digital camera devices

  • Author

    Bateman, Philip ; Ho, Anthony T.S. ; Woodward, Alan

  • Author_Institution
    Dept. of Comput., Univ. of Surrey, Guildford, UK
  • fYear
    2010
  • fDate
    May 30 2010-June 2 2010
  • Firstpage
    3056
  • Lastpage
    3059
  • Abstract
    In this paper, we propose the novel use of Statistical Process Control (SPC) as a tool for identifying anomalies in the image acquisition process of a digital camera, for the purpose of camera identification. Control charts are used to illustrate the overall level of control associated with several devices (models include Apple iPhone 3G and 3GS, Nokia N97, and Leica D-Lux4), which are in turn reviewed in accordance with the Western Electric Rules for identifying assignable causes for the observed variation. X-Moving Range and Exponentially Weighted Moving Average (EWMA) control charts are used to highlight the variation for a subset of the devices. By implementing such a statistical model, the forensic investigator is much better positioned to understand the behaviour of a particular device, and is ultimately able to identify the most unstable feature of the cameras image acquisition process, thereby establishing a suitable fingerprint for matching images to their source.
  • Keywords
    cameras; control charts; control engineering computing; image matching; moving average processes; statistical process control; 3GS; Apple iPhone 3G; Leica D-Lux4; Nokia N97; accurate detection; camera identification; control charts; digital camera devices; exponentially weighted moving average; image acquisition process; image matching; out-of-control variations; statistical process control; Control charts; Digital cameras; Feature extraction; Fingerprint recognition; Forensics; Image sensors; Law; Legal factors; Process control; Programmable control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-5308-5
  • Electronic_ISBN
    978-1-4244-5309-2
  • Type

    conf

  • DOI
    10.1109/ISCAS.2010.5537995
  • Filename
    5537995