Wavelet analysis of current measurements for mixed-signal circuit testing

Author

Dimopoulos, M.G. ; Papakostas, D.K. ; Vassios, B.D. ; Hatzopoulos, A.A.

Author_Institution

Dept. of Electron., Alexander Tech. Educat. Inst. of Thessaloniki, Thessaloniki, Greece

fYear

2010

fDate

May 30 2010-June 2 2010

Firstpage

1923

Lastpage

1926

Abstract

In this paper a test method based on the wavelet transformation of the measured supply current (I_PS) and load current (I_L) waveforms is presented. In the wavelet analysis, the test metrics used are utilizing the initial three decomposition levels of the measured signal. Experimental comparative results between the proposed method, a test method based on the RMS value of I_PS, a test method utilizing the harmonic magnitude components of the I_PS spectrum and a method based on the wavelet transformation of the I_PS are presented showing the effectiveness of the proposed testing scheme.

Keywords

electric current measurement; integrated circuit testing; mixed analogue-digital integrated circuits; wavelet transforms; current measurement; decomposition levels; harmonic magnitude components; load current; mixed-signal circuit testing; supply current; wavelet analysis; wavelet transformation; Circuit testing; Continuous wavelet transforms; Current measurement; Current supplies; Discrete wavelet transforms; Electrical fault detection; Fourier transforms; Frequency; Wavelet analysis; Wavelet transforms;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on

Conference_Location

Paris

Print_ISBN

978-1-4244-5308-5

Electronic_ISBN

978-1-4244-5309-2

Type

conf

DOI

10.1109/ISCAS.2010.5537999

Filename

5537999