DocumentCode :
3391444
Title :
Computation of lower and upper bounds for switching activity: a unified approach
Author :
Krishna, Vamsi ; Chandramouli, R. ; Ranganathan, N.
Author_Institution :
Dept. of Comput. Sci. & Eng., Univ. of South Florida, Tampa, FL, USA
fYear :
1998
fDate :
4-7 Jan 1998
Firstpage :
230
Lastpage :
233
Abstract :
Accurate switching activity estimation is crucial for power budgeting. It is impractical to obtain an accurate estimate by simulating the circuit for all possible inputs. An alternate approach would be to compute tight bounds for the switching activity. In this paper, we propose a non-simulative method to compute bounds for switching activity at the logic level. First, we show that the switching activity can be modeled as the Bayesian distance for an abstract two class problem. The computation of the upper and lower bounds for the switching activity is unified in to a single function, ψ(α,p,ρ), where α is a parameter, ρ is the temporal correlation factor and p is the signal probability. The constraints on α for ψ(α,p,ρ) to be tight upper and lower bounds are derived. The proposed approach computes bounds for individual gate switching. Experimental results are obtained by taking spatial and temporal correlations into account. The computations are simple and fast
Keywords :
Markov processes; VLSI; digital integrated circuits; integrated circuit design; integrated logic circuits; logic design; probability; switching; Bayesian distance; VLSI design; abstract two class problem; individual gate switching; logic level; lower bounds; nonsimulative method; power budgeting; signal probability; switching activity estimation; upper bounds; Capacitance; Circuit simulation; Delay estimation; Energy consumption; Logic; Microelectronics; Minimization; Power dissipation; Power engineering computing; Signal processing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 1998. Proceedings., 1998 Eleventh International Conference on
Conference_Location :
Chennai
ISSN :
1063-9667
Print_ISBN :
0-8186-8224-8
Type :
conf
DOI :
10.1109/ICVD.1998.646608
Filename :
646608
Link To Document :
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