DocumentCode
3391444
Title
Computation of lower and upper bounds for switching activity: a unified approach
Author
Krishna, Vamsi ; Chandramouli, R. ; Ranganathan, N.
Author_Institution
Dept. of Comput. Sci. & Eng., Univ. of South Florida, Tampa, FL, USA
fYear
1998
fDate
4-7 Jan 1998
Firstpage
230
Lastpage
233
Abstract
Accurate switching activity estimation is crucial for power budgeting. It is impractical to obtain an accurate estimate by simulating the circuit for all possible inputs. An alternate approach would be to compute tight bounds for the switching activity. In this paper, we propose a non-simulative method to compute bounds for switching activity at the logic level. First, we show that the switching activity can be modeled as the Bayesian distance for an abstract two class problem. The computation of the upper and lower bounds for the switching activity is unified in to a single function, ψ(α,p,ρ), where α is a parameter, ρ is the temporal correlation factor and p is the signal probability. The constraints on α for ψ(α,p,ρ) to be tight upper and lower bounds are derived. The proposed approach computes bounds for individual gate switching. Experimental results are obtained by taking spatial and temporal correlations into account. The computations are simple and fast
Keywords
Markov processes; VLSI; digital integrated circuits; integrated circuit design; integrated logic circuits; logic design; probability; switching; Bayesian distance; VLSI design; abstract two class problem; individual gate switching; logic level; lower bounds; nonsimulative method; power budgeting; signal probability; switching activity estimation; upper bounds; Capacitance; Circuit simulation; Delay estimation; Energy consumption; Logic; Microelectronics; Minimization; Power dissipation; Power engineering computing; Signal processing;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, 1998. Proceedings., 1998 Eleventh International Conference on
Conference_Location
Chennai
ISSN
1063-9667
Print_ISBN
0-8186-8224-8
Type
conf
DOI
10.1109/ICVD.1998.646608
Filename
646608
Link To Document