• DocumentCode
    3391444
  • Title

    Computation of lower and upper bounds for switching activity: a unified approach

  • Author

    Krishna, Vamsi ; Chandramouli, R. ; Ranganathan, N.

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Univ. of South Florida, Tampa, FL, USA
  • fYear
    1998
  • fDate
    4-7 Jan 1998
  • Firstpage
    230
  • Lastpage
    233
  • Abstract
    Accurate switching activity estimation is crucial for power budgeting. It is impractical to obtain an accurate estimate by simulating the circuit for all possible inputs. An alternate approach would be to compute tight bounds for the switching activity. In this paper, we propose a non-simulative method to compute bounds for switching activity at the logic level. First, we show that the switching activity can be modeled as the Bayesian distance for an abstract two class problem. The computation of the upper and lower bounds for the switching activity is unified in to a single function, ψ(α,p,ρ), where α is a parameter, ρ is the temporal correlation factor and p is the signal probability. The constraints on α for ψ(α,p,ρ) to be tight upper and lower bounds are derived. The proposed approach computes bounds for individual gate switching. Experimental results are obtained by taking spatial and temporal correlations into account. The computations are simple and fast
  • Keywords
    Markov processes; VLSI; digital integrated circuits; integrated circuit design; integrated logic circuits; logic design; probability; switching; Bayesian distance; VLSI design; abstract two class problem; individual gate switching; logic level; lower bounds; nonsimulative method; power budgeting; signal probability; switching activity estimation; upper bounds; Capacitance; Circuit simulation; Delay estimation; Energy consumption; Logic; Microelectronics; Minimization; Power dissipation; Power engineering computing; Signal processing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 1998. Proceedings., 1998 Eleventh International Conference on
  • Conference_Location
    Chennai
  • ISSN
    1063-9667
  • Print_ISBN
    0-8186-8224-8
  • Type

    conf

  • DOI
    10.1109/ICVD.1998.646608
  • Filename
    646608