• DocumentCode
    3391913
  • Title

    System engineering considerations and methodology for effecting a cohesive functional/parametric testing strategy

  • Author

    Granieri, Michael N.

  • Author_Institution
    Giordano Associates Inc., Arlington, VA, USA
  • fYear
    1989
  • fDate
    25-28 Sep 1989
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    The authors consider RFI (ready for issue) methodologies and techniques that can be used to effect a cohesive functional/parametric testing strategy. A number of functional/parametric testing scenarios are discussed from the viewpoint of assessing diagnostic accuracy, functional/parametric test correlation, test data maturation, and testing throughput. It is concluded that the key to establishing an effective and cohesive functional/parametric testing strategy is diagnostic information management within the context of the concurrent engineering process. Diagnostic information management enables more effective RFI testing to be performed at all levels of test. Specifically, diagnostic information management is the key to effecting more efficient (i.e. faster test times) and accurate (i.e. fault isolation resolution) test program sets because it enables the test strategies to capture the best features of both functional and parametric testing and use them in a complementary manner
  • Keywords
    automatic test equipment; automatic testing; electronic engineering computing; electronic equipment testing; military systems; systems engineering; ATE; correlation; diagnostic accuracy; diagnostic information management; functional/parametric testing; maturation; military systems; systems engineering; throughput; Aircraft; Assembly; Built-in self-test; Certification; Emulation; Marine vehicles; Radiofrequency interference; Software testing; System testing; Systems engineering and theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '89. IEEE Automatic Testing Conference. The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.
  • Conference_Location
    Philadelphia, PA
  • Type

    conf

  • DOI
    10.1109/AUTEST.1989.81091
  • Filename
    81091