• DocumentCode
    3392342
  • Title

    The non-equal-interval direct new information Verhulst GM(1,1) model with two times fitting and its application to test data processing

  • Author

    Luo, Youxin ; He, Zheming

  • Author_Institution
    Coll. of Mech. Eng., Hunan Univ. of Arts & Sci., Changde, China
  • Volume
    1
  • fYear
    2009
  • fDate
    19-20 Dec. 2009
  • Firstpage
    85
  • Lastpage
    88
  • Abstract
    The non-equal-interval direct Verhulst new information GM(1,1) model with two times fitting was built which extended equal interval to non-equal-interval and suited for general data modeling and estimating parameters of direct Verhulst GM(1,1). The new model chooses the nth component of X(0) as the starting conditions of the grey differential model. The new model need not pre-process the primitive data, accumulated generating operation (AGO) and inverse accumulated generating operation (IAGO). It was not only suited for equal interval data modeling, but also for non-equal interval data modeling. As the new information is fully used, the accuracy of fitting is higher. The example shows that the new model is simple and practical. The new model is worth expanding and applying in test data processing or test on-line monitoring.
  • Keywords
    data analysis; differential equations; grey systems; surface fitting; accumulated generating operation; grey differential model; inverse accumulated generating operation; non-equal-interval direct new information Verhulst GM(1,1) model; test data processing; two times fitting; Art; Data processing; Educational institutions; Electronic equipment testing; Equations; Intelligent transportation systems; Mechanical engineering; Power system modeling; Predictive models; System testing; Data mining; Verhulst direct GM(1,1); new information; non-equal interval; two times fitting;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and Intelligent Transportation System (PEITS), 2009 2nd International Conference on
  • Conference_Location
    Shenzhen
  • Print_ISBN
    978-1-4244-4544-8
  • Type

    conf

  • DOI
    10.1109/PEITS.2009.5406958
  • Filename
    5406958