DocumentCode
3392391
Title
Diffraction at the vertex of a quarter plane
Author
Albani, M. ; Capolino, F. ; Maci, S.
Author_Institution
Dept. of Matter Phys. & Adv. Techn, Messina Univ., Italy
Volume
2
fYear
2004
fDate
20-25 June 2004
Firstpage
1991
Abstract
The uniform theory of diffraction (UTD) technique has been thoroughly employed for practical applications such as the prediction of the radar cross section (RCS) of complex targets, or the computation of radiation characteristics of antennas in their operating platform (aircraft, ships, satellites, etc.). The UTD framework is based on a diffraction coefficient constructed via canonical diffraction problems. Among these problems, the quarter plane problem plays an fundamental role. Edge diffracted rays are usually added and higher order contributions, namely vertex and doubly diffracted rays, also need to be added. We focus our attention on the vertex diffracted contribution consisting of dominant and subdominant terms. Exact solutions for the quarter plane (QP) diffraction have been given in literature (Satterwhite, R.S. and Kouyoumjian, R.G., 1970; Smyshlyaev, V.P., 1993), but they are difficult to implement and not well suited for practical asymptotic evaluation. Our solution, although not derived from the exact solution of the QP, is nicely simple and uniformly compensates for the discontinuity of the leading single and double diffraction UTD contribution at their shadow boundaries.
Keywords
geometrical theory of diffraction; RCS; UTD; antenna radiation characteristics; diffraction coefficient; doubly diffracted rays; edge diffracted rays; quarter plane diffraction; quarter plane vertex; radar cross section; uniform theory of diffraction; vertex diffracted rays; Antenna theory; Brillouin scattering; Electromagnetic scattering; Integral equations; Physical theory of diffraction; Physics computing; Quadratic programming; Radar antennas; Radar cross section; Satellite antennas;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 2004. IEEE
Print_ISBN
0-7803-8302-8
Type
conf
DOI
10.1109/APS.2004.1330596
Filename
1330596
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