Title :
EO sampling methods for real-time THz imaging
Author :
Hattori, Toshiaki ; Sakamoto, Masaya
Author_Institution :
Inst. of Appl. Phys., Univ. of Tsukuba, Tsukuba
Abstract :
We have developed a method of real-time terahertz (THz) imaging in which image deformation due to nonuniformity of residual birefringence in the electro-optic (EO) sampling crystal is corrected. Real-time THz imaging using intense THz pulses and two-dimensional EO sampling can suffer from birefringence nonuniformity of the EO crystal since the birefringence is explicitly used for the linear detection of the THz field. In the proposed method, the distribution of the residual birefringence of the EO crystal is measured and used for image correction. Deformation-free images of the spatial profile of a focused THz pulse were obtained.
Keywords :
birefringence; crystals; electro-optical devices; sampling methods; submillimetre wave imaging; submillimetre wave spectra; THz pulses; birefringence nonuniformity; deformation-free images; electro-optic sampling crystal; image correction; image deformation; linear detection; real-time THz imaging; residual birefringence; sampling methods; Birefringence; Electrooptic effects; Image sampling; Optical imaging; Optical polarization; Optical pulse generation; Probes; Pulse amplifiers; Sampling methods; Ultrafast optics;
Conference_Titel :
Infrared and Millimeter Waves, 2007 and the 2007 15th International Conference on Terahertz Electronics. IRMMW-THz. Joint 32nd International Conference on
Conference_Location :
Cardiff
Print_ISBN :
978-1-4244-1438-3
DOI :
10.1109/ICIMW.2007.4516790