Title :
IEE Colloquium on Applied Statistical Pattern Recognition (Ref. No. 1999/063)
Abstract :
The following topics were dealt with: statistical pattern recognition; wavelets; support vector machines; 2D shape recognition; signal separation; one-to-many mappings; radial basis function networks; auto-adaptive matched filter; nonlinear feature space transformations; weather radar image recognition; signal analysis; statistical image restoration; complex image interpretation; cell detection in DIC microscope images; textured image segmentation by Markov random fields; scene structure inference from images; texture classification; and shape classification
Keywords :
statistical analysis; DIC microscope images; Markov random fields; adaptive matched filter; cell detection; image restoration; nonlinear feature space transformations; radial basis function networks; scene structure inference; shape classification; shape recognition; signal analysis; signal separation; statistical pattern recognition; support vector machines; texture classification; textured image segmentation; wavelets; weather radar image recognition;
Conference_Titel :
Applied Statistical Pattern Recognition (Ref. No. 1999/063), IEE Colloquium on
Conference_Location :
Brimingham
