Title :
Mixed-signal test
Author :
Majhi, Ananta Ii ; Agrawal, Vishwani D.
Author_Institution :
Mentor Graphics (India) Ltd., Hyderabad, India
Abstract :
The test process for analog circuits currently focuses on performance verification, generally known as functional testing. For many classes of analog circuits, there are already well-known and accepted functional tests. However, the test development time and test set application time are too long for today´s circuits. For new products, short product cycles and time-to-market are critical considerations. Test development time has two main factors: the presence of noise and a lack of powerful tools, models and practices. Besides, functional testing has been reported to fail in many system applications. Today, more often than before, there is a consensus that structural testing is a viable solution. A brief survey of the current trends and challenges in mixed-signal testing is given in this paper
Keywords :
automatic testing; built-in self test; design for testability; electronic engineering computing; fault diagnosis; integrated circuit testing; mixed analogue-digital integrated circuits; BIST; DFT; DSP-based testing; analog test; analog test CAD tools; digital test; dynamic current testing; interconnect testing; mixed-signal ICs; mixed-signal testing; structural testing; Analog circuits; Automatic test pattern generation; Automatic testing; Circuit analysis; Circuit faults; Circuit simulation; Circuit testing; Integrated circuit testing; Signal processing algorithms; System testing;
Conference_Titel :
VLSI Design, 1998. Proceedings., 1998 Eleventh International Conference on
Conference_Location :
Chennai
Print_ISBN :
0-8186-8224-8
DOI :
10.1109/ICVD.1998.646619
