Downsizing with VXIbus: opportunities and limitations in factory, field, and portable environments

Author

DesJardin, Larry

Author_Institution

Hewlett-Packard Co., Loveland, CO, USA

fYear

1989

fDate

25-28 Sep 1989

Firstpage

55

Lastpage

62

Abstract

The author examines the technical constraints of downsizing for factory, field, and portable environments and develops metrics for comparing functional densities. Two examples of downsized VXIbus systems are evaluated. One is a C-size system with DC to microwave capability for factory floor or transportable ATE (automatic test equipment) applications. The second is a B-size system that is a lower performance equivalent of the C-size system with the microwave functionality removed; it is applicable for transportable and portable ATE. Actual examples of reduced-size test equipment ranging from battery operated testers to rack mounted, factory-based test systems are shown and evaluated. It is concluded that the VXIbus can deliver substantial reductions in test system size for factory, transportable, and portable ATE. Size reduction averages about 3 to 1 over equivalent HP-IB rack and stack instruments

Keywords

automatic test equipment; computer interfaces; production testing; B-size system; C-size system; automatic test equipment; battery operated testers; computer interfaces; downsized VXIbus systems; factory floor; portable ATE; rack mounted tester; reduced-size test equipment; transportable ATE; Batteries; Costs; Energy consumption; Instruments; Manufacturing; Packaging; Production facilities; System testing; Test equipment; USA Councils;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON '89. IEEE Automatic Testing Conference. The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.

Conference_Location

Philadelphia, PA

Type

conf

DOI

10.1109/AUTEST.1989.81099

Filename

81099