Title :
Nearly Quantum Limited Two-Stage SQUID Amplifiers for the Frequency Domain Multiplexing of TES Based X-ray and Infrared Detectors
Author :
Gottardi, L. ; Kiviranta, M. ; van der Kuur, J. ; Akamatsu, H. ; Bruijn, M.P. ; den Hartog, R.
Author_Institution :
SRON Netherlands Inst. for Space Res., Utrecht, Netherlands
Abstract :
The frequency domain multiplexing (FDM) readout of arrays of transition edges sensors for the X-IFU/Athena and SAFARI/SPICA instruments requires SQUID amplifiers with low input inductance, low flux noise, high-dynamic range and low power consumption. We report the performance of two-stage SQUID amplifiers developed at VTT coupled to multiple high-Q LC resonators of the SRON FDM readout operating in the frequency range from 2 to 5 MHz. The SQUIDs have been tested in the following configurations: 1) the two SQUIDs at base temperature with open input; 2) the amplifier SQUID at 1K temperature and the front-end SQUID at base temperature in the FDM readout of low-G TES bolometers; and 3) and in the FDM readout of X-ray microcalorimeter arrays with both SQUIDS at base temperature. We measured an input flux noise equal to 0.18 μΦ0/Hz1/2 at 20 mK, equivalent to an energy resolution of 9 b. The measured current noise at the SQUID input is ~1 pA/Hz1/2 at 20 mK, which corresponds to a coupled energy resolution of about 15 b.
Keywords :
SQUIDs; X-ray detection; bolometers; calorimeters; frequency division multiplexing; infrared detectors; SAFARI-SPICA instruments; SRON FDM readout; TES based X-ray detectors; VTT; X-IFU-Athena; X-ray microcalorimeter arrays; frequency 2 MHz to 5 MHz; frequency domain multiplexing readout; high-Q LC resonators; infrared detectors; low-G TES bolometers; temperature 1 K; transition edges sensors; two-stage SQUID amplifiers; Bolometers; Current measurement; Frequency division multiplexing; Noise; Noise measurement; SQUIDs; Temperature measurement; Bolometers; SQUIDs; X-ray detectors; frequency domain multiplexing; transition edge sensor;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2014.2369234