DocumentCode
3393863
Title
Solving the SoC test scheduling problem using network flow and reconfigurable wrappers
Author
Koranne, Sandeep
Author_Institution
Tanner Res. Inc., USA
fYear
2003
fDate
24-26 March 2003
Firstpage
93
Lastpage
98
Abstract
Test scheduling for core-based SoCs is a challenging problem. Test schedules must be crafted with the objectives of minimizing testing time and ATE vector memory requirements, to reduce test cost, under the constraints of total available test access mechanism (TAM) width. Prior research in test scheduling has mainly used search procedures like ILP and rectangle packing to solve this problem, but these approaches are inherently computationally expensive. In this paper we describe a novel algorithm to solve the test scheduling problem using a combination of network flow algorithms, malleable job scheduling and reconfigurable wrapper design. Our approximation algorithm has polynomial time complexity and produces schedules close to the theoretical lower bound. Extensive experimental results using the new ITC´02 SoC benchmarks validate the quality of our solutions.
Keywords
automatic test equipment; integrated circuit testing; scheduling; system-on-chip; ATE vector memory; SoC benchmarks; SoC test scheduling problem; approximation algorithm; automatic test equipment; flow algorithms; malleable job scheduling; network flow; polynomial time complexity; reconfigurable wrapper design; reconfigurable wrappers; rectangle packing; test access mechanism; test cost; testing time; Algorithm design and analysis; Approximation algorithms; Automatic testing; Costs; Firewire; Integrated circuit testing; Job design; Knowledge transfer; Processor scheduling; Scheduling algorithm;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design, 2003. Proceedings. Fourth International Symposium on
Print_ISBN
0-7695-1881-8
Type
conf
DOI
10.1109/ISQED.2003.1194715
Filename
1194715
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