DocumentCode :
3393863
Title :
Solving the SoC test scheduling problem using network flow and reconfigurable wrappers
Author :
Koranne, Sandeep
Author_Institution :
Tanner Res. Inc., USA
fYear :
2003
fDate :
24-26 March 2003
Firstpage :
93
Lastpage :
98
Abstract :
Test scheduling for core-based SoCs is a challenging problem. Test schedules must be crafted with the objectives of minimizing testing time and ATE vector memory requirements, to reduce test cost, under the constraints of total available test access mechanism (TAM) width. Prior research in test scheduling has mainly used search procedures like ILP and rectangle packing to solve this problem, but these approaches are inherently computationally expensive. In this paper we describe a novel algorithm to solve the test scheduling problem using a combination of network flow algorithms, malleable job scheduling and reconfigurable wrapper design. Our approximation algorithm has polynomial time complexity and produces schedules close to the theoretical lower bound. Extensive experimental results using the new ITC´02 SoC benchmarks validate the quality of our solutions.
Keywords :
automatic test equipment; integrated circuit testing; scheduling; system-on-chip; ATE vector memory; SoC benchmarks; SoC test scheduling problem; approximation algorithm; automatic test equipment; flow algorithms; malleable job scheduling; network flow; polynomial time complexity; reconfigurable wrapper design; reconfigurable wrappers; rectangle packing; test access mechanism; test cost; testing time; Algorithm design and analysis; Approximation algorithms; Automatic testing; Costs; Firewire; Integrated circuit testing; Job design; Knowledge transfer; Processor scheduling; Scheduling algorithm;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design, 2003. Proceedings. Fourth International Symposium on
Print_ISBN :
0-7695-1881-8
Type :
conf
DOI :
10.1109/ISQED.2003.1194715
Filename :
1194715
Link To Document :
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