Title :
A CAD-oriented modeling approach of frequency-dependent behavior of substrate noise coupling for mixed-signal IC design
Author :
Lan, Hai ; Yu, Zhiping ; Dutton, Robert W.
Author_Institution :
Center for Integrated Syst., Stanford Univ., CA, USA
Abstract :
A simple, efficient CAD-oriented equivalent circuit modeling approach of frequency-dependent behavior of substrate noise coupling is presented. It is shown that the substrate exhibits significant frequency-dependent characteristics for high frequency applications using epitaxial layers on a highly doped substrate. Using the proposed modeling approach, circuit topographies consisting of only ideal lumped circuit elements can be synthesized to accurately represent the frequency response using y-parameters. The proposed model is well-suited for use in standard circuit simulators. The extracted model is shown to be in good agreement with rigorous 3D device simulation results.
Keywords :
circuit CAD; circuit simulation; equivalent circuits; frequency response; integrated circuit design; integrated circuit modelling; integrated circuit noise; lumped parameter networks; mixed analogue-digital integrated circuits; substrates; 3D device simulation; CAD oriented modeling; circuit topography; epitaxial layers; equivalent circuit modeling; frequency dependent behavior; frequency response; high frequency applications; highly doped substrate; ideal lumped circuit element; mixed signal IC design; standard circuit simulators; substrate noise coupling; y parameters; Circuit simulation; Coupling circuits; Epitaxial layers; Equivalent circuits; Frequency; Integrated circuit modeling; Integrated circuit noise; Semiconductor process modeling; Substrates; Surfaces;
Conference_Titel :
Quality Electronic Design, 2003. Proceedings. Fourth International Symposium on
Print_ISBN :
0-7695-1881-8
DOI :
10.1109/ISQED.2003.1194731
