DocumentCode :
3394141
Title :
Concurrent engineering: an overview for Autotestcon
Author :
Pennell, James P. ; Winner, Robert I. ; Bertrand, Harold E. ; Slusarczuk, Marko M G
Author_Institution :
Inst. for Defense Anal., Alexandria, VA, USA
fYear :
1989
fDate :
25-28 Sep 1989
Firstpage :
88
Lastpage :
99
Abstract :
The authors summarize a 1988 investigation of concurrent engineering and its role in weapons system acquisition with some attention to testability implications. They describe the investigation, present highlights of the evidence, and set forth the principal findings and recommendations, related them to testability where appropriate. Included is the definition of concurrent engineering developed during this study. Some benefits reported include 60% reduction in product development time, elimination of two thirds of the inspectors in one factory, and several-million-dollars annual savings in chemical and soldering processes. The methods and technologies of concurrent engineering are outlined and the process management ideas, the computer support, and the problem-solving techniques are considered. A conceptual framework is offered to describe the continuing research needed in this area
Keywords :
automatic testing; economics; engineering computing; management; manufacturing computer control; manufacturing data processing; military computing; production testing; quality control; weapons; 1988; Autotestcon; computer support; concurrent engineering; economics; problem-solving techniques; process management; product development time; savings; testability; weapons system acquisition; Chemical processes; Chemical products; Chemical technology; Concurrent engineering; Product development; Production facilities; Soldering; System testing; Technology management; Weapons;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '89. IEEE Automatic Testing Conference. The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.
Conference_Location :
Philadelphia, PA
Type :
conf
DOI :
10.1109/AUTEST.1989.81104
Filename :
81104
Link To Document :
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