• DocumentCode
    3394190
  • Title

    Fault tolerant engineering methodology and the impact on ATE

  • Author

    Doskocil, Douglas C.

  • Author_Institution
    GE Autom. Syst. Dept., Burlington, MA, USA
  • fYear
    1989
  • fDate
    25-28 Sep 1989
  • Firstpage
    113
  • Lastpage
    117
  • Abstract
    Many new weapon systems are required to provide fault tolerance in order to achieve better overall reliability and weapon system effectiveness. A structured systems approach is required to implement efficiently the different forms of fault tolerance and reconfiguration in order to achieve a cost- and mission-effective fault-tolerant system, one that will meet the fault-tolerant requirements as well as minimize negative effects on performance, on-board diagnostics, off-board diagnostics, and life cycle cost. Such an approach applied to an advanced avionics system is described. Operational definitions for the relevant terms are given and applied to the requirements´ synthesis and allocation efforts, the first steps of the process. The rest of the design process is described, including functional decomposition, parallel path identification, and a method for modeling the effectiveness of the fault tolerance as it affects both the weapon system and the support system. Options for implementing the system are delineated, including design techniques which optimize inherent fault-tolerant characteristics, real-time algorithms for the implementation of certain reconfiguration strategies, and architectural solutions
  • Keywords
    CAD; aerospace computing; aircraft instrumentation; automatic test equipment; fault location; military computing; military systems; reliability; weapons; ATE; BIT; avionics; cost; design; effectiveness; fault tolerance; functional decomposition; modeling; parallel path identification; real-time algorithms; reconfiguration; reliability; structured systems; support system; synthesis; weapon; Aerospace electronics; Algorithm design and analysis; Costs; Design optimization; Fault diagnosis; Fault tolerance; Fault tolerant systems; Process design; Reliability engineering; Weapons;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '89. IEEE Automatic Testing Conference. The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.
  • Conference_Location
    Philadelphia, PA
  • Type

    conf

  • DOI
    10.1109/AUTEST.1989.81107
  • Filename
    81107