DocumentCode :
3394498
Title :
Information extraction from sensor nodes using air-borne radar and back-scatter modulation
Author :
Vanjari, Srinivas V. ; Drogmeier, J.V. ; Bell, Mark R.
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN
fYear :
2005
fDate :
17-20 Oct. 2005
Firstpage :
1421
Abstract :
Radar imaging is a powerful tool in remote sensing due to its ability to image vast areas with high resolution. However, the ability to sense a particular parameter depends on the extent to which the parameter affects the reflected microwave radiation. In this respect, multi-functional sensor nodes offer an immense potential to sense environmental parameters which cannot be directly sensed by radar imaging techniques. With this motivation, we develop techniques to collect information at an air-borne radar from a large group of sensor nodes. Back-scatter modulation is used on the sensors. The techniques utilize synthetic aperture radar (SAR) processing to resolve responses from multiple sensors and to simultaneously obtain a geographic map of the sensor locations. Sensor and clutter returns are separated by utilizing the ability of the sensors to modulate the radar return. The sensor modulation is structured such that sensor and clutter returns can be separated in the spatial frequency domain
Keywords :
airborne radar; backscatter; feature extraction; image resolution; image sensors; radar imaging; remote sensing by radar; synthetic aperture radar; SAR; airborne radar; backscatter modulation; information extraction; microwave radiation reflection; multifunctional sensor nodes; radar imaging techniques; remote sensing; sensor nodes; spatial frequency domain; synthetic aperture radar processing; Data mining; Frequency domain analysis; Image resolution; Image sensors; Radar clutter; Radar imaging; Radar remote sensing; Remote sensing; Spatial resolution; Synthetic aperture radar;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Military Communications Conference, 2005. MILCOM 2005. IEEE
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-9393-7
Type :
conf
DOI :
10.1109/MILCOM.2005.1605876
Filename :
1605876
Link To Document :
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