DocumentCode :
3394510
Title :
Effect of potential disorder on shot noise suppression in nanoscale devices
Author :
Marconcini, Paolo
Author_Institution :
Dipt. di Ing. dell´Inf., Univ. di Pisa, Pisa, Italy
fYear :
2013
fDate :
15-17 July 2013
Firstpage :
146
Lastpage :
151
Abstract :
With the progressive downscaling of device dimensions and the corresponding reduction of the signal-to-noise ratio, the effect of noise on the operation of nanoscale devices increases and thus particular care has to be devoted to its study. Here we numerically analyze the effect of one-dimensional and two-dimensional potential disorder on the shot noise of a device based on a semiconductor heterostructure and we show that only in very particular conditions the diffusive noise regime is reached, while in more general cases only a gradual increase of shot noise toward the full shot noise behavior of strongly localized systems is observed as the disorder increases.
Keywords :
electron device noise; nanoelectronics; semiconductor heterojunctions; shot noise; diffusive noise regime; nanoscale devices; one-dimensional potential disorder; semiconductor heterostructure; shot noise suppression; strongly localized systems; two-dimensional potential disorder; Green´s function methods; HEMTs; Impurities; MODFETs; Nanoscale devices; Noise; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanoscale Architectures (NANOARCH), 2013 IEEE/ACM International Symposium on
Conference_Location :
Brooklyn, NY
Print_ISBN :
978-1-4799-0873-8
Type :
conf
DOI :
10.1109/NanoArch.2013.6623060
Filename :
6623060
Link To Document :
بازگشت