DocumentCode
3394510
Title
Effect of potential disorder on shot noise suppression in nanoscale devices
Author
Marconcini, Paolo
Author_Institution
Dipt. di Ing. dell´Inf., Univ. di Pisa, Pisa, Italy
fYear
2013
fDate
15-17 July 2013
Firstpage
146
Lastpage
151
Abstract
With the progressive downscaling of device dimensions and the corresponding reduction of the signal-to-noise ratio, the effect of noise on the operation of nanoscale devices increases and thus particular care has to be devoted to its study. Here we numerically analyze the effect of one-dimensional and two-dimensional potential disorder on the shot noise of a device based on a semiconductor heterostructure and we show that only in very particular conditions the diffusive noise regime is reached, while in more general cases only a gradual increase of shot noise toward the full shot noise behavior of strongly localized systems is observed as the disorder increases.
Keywords
electron device noise; nanoelectronics; semiconductor heterojunctions; shot noise; diffusive noise regime; nanoscale devices; one-dimensional potential disorder; semiconductor heterostructure; shot noise suppression; strongly localized systems; two-dimensional potential disorder; Green´s function methods; HEMTs; Impurities; MODFETs; Nanoscale devices; Noise; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanoscale Architectures (NANOARCH), 2013 IEEE/ACM International Symposium on
Conference_Location
Brooklyn, NY
Print_ISBN
978-1-4799-0873-8
Type
conf
DOI
10.1109/NanoArch.2013.6623060
Filename
6623060
Link To Document