• DocumentCode
    3394510
  • Title

    Effect of potential disorder on shot noise suppression in nanoscale devices

  • Author

    Marconcini, Paolo

  • Author_Institution
    Dipt. di Ing. dell´Inf., Univ. di Pisa, Pisa, Italy
  • fYear
    2013
  • fDate
    15-17 July 2013
  • Firstpage
    146
  • Lastpage
    151
  • Abstract
    With the progressive downscaling of device dimensions and the corresponding reduction of the signal-to-noise ratio, the effect of noise on the operation of nanoscale devices increases and thus particular care has to be devoted to its study. Here we numerically analyze the effect of one-dimensional and two-dimensional potential disorder on the shot noise of a device based on a semiconductor heterostructure and we show that only in very particular conditions the diffusive noise regime is reached, while in more general cases only a gradual increase of shot noise toward the full shot noise behavior of strongly localized systems is observed as the disorder increases.
  • Keywords
    electron device noise; nanoelectronics; semiconductor heterojunctions; shot noise; diffusive noise regime; nanoscale devices; one-dimensional potential disorder; semiconductor heterostructure; shot noise suppression; strongly localized systems; two-dimensional potential disorder; Green´s function methods; HEMTs; Impurities; MODFETs; Nanoscale devices; Noise; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoscale Architectures (NANOARCH), 2013 IEEE/ACM International Symposium on
  • Conference_Location
    Brooklyn, NY
  • Print_ISBN
    978-1-4799-0873-8
  • Type

    conf

  • DOI
    10.1109/NanoArch.2013.6623060
  • Filename
    6623060